Cascade Microtech Inc. (Nasdaq:CSCD) announced that its VueTrack™ probe-to-pad alignment solution and its S-Technology™ Pyramid production test probe cards have been selected by the editors of Test & Measurement World as finalists for "Best in Test" products in the category of Wafer Probing. The "Best in Test" awards are presented annually by Test & Measurement World to honor important and innovative new products and services in the electronics test and measurement industry. VueTrack for unattended over-temperature test enables automatic probe-to-pad alignment by using a downward-looking microscope for measuring the probe tips and the wafer locations with the chuck in the same position in which the electrical measurement will be made. By enabling unattended testing over multiple temperatures ranging from -50 to 300°C, VueTrack eliminates the need for operator intervention and provides increased data throughput and high electrical test accuracy.

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